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Solid-state energy-dispersion spectrometer for electron-microprobe x-ray analysis.

作者信息

Fitzgerald R, Keil K, Heinrich K F

出版信息

Science. 1968 Feb 2;159(3814):528-30. doi: 10.1126/science.159.3814.528.

Abstract

Improved lithium-drifted silicon solid-state detectors allow detection and energy dispersion of x-rays of about 3 to 30 kiloelectron volts in the electron-microprobe x-ray analyzer. Energy resolution is sufficient to separate peaks of characteristic x-rays of elements adjacent in the periodic system at atomic number 20 and higher. The detected x-ray spectrum emitted from an unknown sample can be recorded with a multichannel analyzer in approximately 60 seconds.

摘要

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