用于透射电子显微镜的高灵敏度透镜耦合慢扫描电荷耦合器件相机。

High-sensitivity lens-coupled slow-scan CCD camera for transmission electron microscopy.

作者信息

Fan G Y, Ellisman M H

机构信息

San Diego Microscopy and Imaging Resource, Department of Neurosciences, University of California at San Diego, La Jolla 92093-0608.

出版信息

Ultramicroscopy. 1993 Sep;52(1):21-9. doi: 10.1016/0304-3991(93)90019-t.

DOI:10.1016/0304-3991(93)90019-t

PMID:8266607

Abstract

A lens-coupled slow-scan CCD camera has been built for transmission electron microscopy (TEM) applications. In this design, a leaded glass window, which is coated with a 20 microns layer of red P20 phosphor, is mounted on the bottom of the microscope. A lens assembly and mirror prism, located outside the microscope vacuum below the leaded glass, relays the image onto a back-thinned 1kx1k charge-coupled device (CCD) detector. This CCD is electronically cooled to below -30 degrees C during operation. It is found that X-ray irradiation, generally found to be annoying in fiber-optically coupled CCD cameras, is completely eliminated by this configuration. The collection efficiency of this system, although not as high as some of the fiber-optically coupled CCD cameras, is high enough to achieve single-electron sensitivity under a high-gain mode.

摘要

已制造出一种用于透射电子显微镜（TEM）应用的透镜耦合慢扫描电荷耦合器件（CCD）相机。在这种设计中，一个涂有20微米厚红色P20荧光粉层的铅玻璃窗口安装在显微镜底部。位于显微镜真空外部、铅玻璃下方的透镜组件和镜棱镜将图像中继到背薄型1kx1k电荷耦合器件（CCD）探测器上。该CCD在运行期间通过电子方式冷却至零下30摄氏度以下。结果发现，在光纤耦合CCD相机中通常令人烦恼的X射线照射，通过这种配置被完全消除。该系统的收集效率虽然不如某些光纤耦合CCD相机高，但足以在高增益模式下实现单电子灵敏度。