Botchway S W, Stevens D L, Hill M A, Jenner T J, O'Neill P
MRC Radiation and Genome Stability Unit, Didcot, Oxfordshire, United Kingdom.
Radiat Res. 1997 Oct;148(4):317-24.
Characteristic aluminum K (AlK) (energy of 1.5 keV) and copper L (CuL) (energy of approximately 0.96 keV) ultrasoft X rays have been used to investigate the effectiveness of the numerous low-energy secondary electrons produced by low-linear energy transfer (LET) ionizing radiation. Cellular inactivation and induction and rejoining of DNA double-strand breaks (DSBs) in Chinese hamster V79-4 cells irradiated as monolayers with these ultrasoft X radiations have been studied under aerobic and anaerobic conditions. The mean cell thickness, determined by confocal laser scanning fluorescence microscopy, was used to calculate the mean dose to the nucleus of the irradiated cells. Relative to 60Co gamma rays, the relative biological effectiveness (RBE) for cellular inactivation at 10% survival is 1.7 +/- 0.1 and 2.3 +/- 0.3 for AIK and CuL ultrasoft X rays, respectively. The RBE values for induction of DSBs of 2.5 +/- 0.2 and 3.0 +/- 0.3 for AlK and CuL X rays, respectively, were determined after irradiation at 277 K using the technique of pulsed-field gel electrophoresis. Induction of DSBs is linearly dependent on dose. Oxygen enhancement ratios of 1.9 and 2.1 for cellular inactivation and DSB induction, respectively, were obtained with AIK X rays. These values are less than those for 60Co gamma radiation. The repair kinetics for rejoining of DSBs after a dose of 15 Gy is similar for both X-ray energies and 60Co gamma rays with a first half-life of 18-22 +/- 5 min. From these studies, it is suggested that induction of DSBs by low-LET radiations such as 60Co gamma rays reflects clustered damage produced predominantly by low-energy electron "track ends," which represent about 30% of the total dose.
具有特征性的铝K(AlK)(能量为1.5keV)和铜L(CuL)(能量约为0.96keV)超软X射线已被用于研究低线性能量传递(LET)电离辐射产生的大量低能二次电子的有效性。在中国仓鼠V79 - 4细胞单层受到这些超软X射线照射后,在需氧和厌氧条件下研究了细胞失活以及DNA双链断裂(DSB)的诱导和重新连接情况。通过共聚焦激光扫描荧光显微镜测定的平均细胞厚度,用于计算受照射细胞细胞核的平均剂量。相对于60Coγ射线,在10%存活率时,AlK和CuL超软X射线的细胞失活相对生物效应(RBE)分别为1.7±0.1和2.3±0.3。使用脉冲场凝胶电泳技术在277K照射后,AlK和CuL X射线诱导DSB的RBE值分别为2.5±0.2和3.0±0.3。DSB的诱导与剂量呈线性相关。AlK X射线的细胞失活和DSB诱导的氧增强比分别为1.9和2.1。这些值低于60Coγ辐射的值。对于两种X射线能量以及60Coγ射线,15Gy剂量后DSB重新连接的修复动力学相似,半衰期为18 - 22±5分钟。从这些研究中可以看出,低LET辐射如60Coγ射线诱导DSB反映了主要由低能电子“径迹末端”产生的簇状损伤,其占总剂量的约30%。