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Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy.

作者信息

Stoner BR, Ma G, Wolter SD, Glass JT

出版信息

Phys Rev B Condens Matter. 1992 May 15;45(19):11067-11084. doi: 10.1103/physrevb.45.11067.

Abstract
摘要

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Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy.
Phys Rev B Condens Matter. 1992 May 15;45(19):11067-11084. doi: 10.1103/physrevb.45.11067.

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