Novel strain-induced defect in thin molecular-beam epitaxy layers.
作者信息
LeGoues FK, Copel M, Tromp R
出版信息
Phys Rev Lett. 1989 Oct 23;63(17):1826-1829. doi: 10.1103/PhysRevLett.63.1826.
PMID:10040683
Abstract
摘要
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Novel strain-induced defect in thin molecular-beam epitaxy layers.
Phys Rev Lett. 1989 Oct 23;63(17):1826-1829. doi: 10.1103/PhysRevLett.63.1826.
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