Lamvik M K, Groves T
Ultramicroscopy. 1976 Dec;2(1):69-75. doi: 10.1016/s0304-3991(76)90467-8.
A fundamental limitation in electron microscopy of organic specimens is radiation damage by the electron beam. To minimize damage it is necessary to have maximum information collection for a given dose. Various modes of operation of conventional and scanning transmission microscopes are compared with respect to their ability to detect small changes in specimen thickness or density with a given signal to noise ratio. Incoherent imaging is assumed, and this is expected to apply to amorphous specimens under a variety of microscope conditions. For either very thin or very thick specimens, the scanning transmission microscope is found to require nearly 10 times less dose than a conventional microscope for the same signal to noise ratio in the image. For specimens of intermediate thickness, scanning and conventional transmission electron microscopes are roughly equivalent.
有机标本电子显微镜检查的一个基本限制是电子束造成的辐射损伤。为了将损伤降至最低，对于给定剂量，有必要进行最大程度的信息采集。就其在给定信噪比下检测标本厚度或密度微小变化的能力而言，对传统显微镜和扫描透射显微镜的各种操作模式进行了比较。假定为非相干成像，并且预计这适用于各种显微镜条件下的非晶标本。对于非常薄或非常厚的标本，发现在图像中具有相同信噪比的情况下，扫描透射显微镜所需的剂量比传统显微镜少近10倍。对于中等厚度的标本，扫描电子显微镜和传统透射电子显微镜大致相当。
