Effect of conditioning with fluoride and phosphoric acid on enamel surfaces as evaluated by scanning electron microscopy and fluoride incorporation.

The etching effect of 50% H-3PO-4 applied together with 2% NaF or SnF-2 was compared with the effect of H-3PO-4 on pre- and postfluoridated enamel by scanning electron microscopy. Substantial etching of enamel resulted with use of 50% H-3PO-4 with 2% NaF. High fluoride incorporation in the surface provided additional protection of the conditioned enamel.