Mulcahy C, Sherriff M, Walter J D, Fenlon M R
Division of Dental Biomaterials, GKT Dental Institute, King's College London, United Kingdom.
Int J Oral Maxillofac Implants. 2000 Jan-Feb;15(1):111-8.
Measurement of misfit at the implant-prosthesis interface is a difficult procedure. One factor common to all methods that attempt to measure 3-dimensional distortion to the micron level is the difficulty in providing verifiably consistent reference points between individual measurement sets. Consequently, the majority of studies use a relative distortion model in which the coordinate reference system is integral to the framework, thus limiting the value of the data gathered. In the method described, the datum plane and the coordinate reference system were set up external to the framework and could be re-established between measurement sets in a verifiable manner.
测量种植体与修复体界面的不匹配是一个困难的过程。所有试图测量微米级三维变形的方法都存在一个共同因素，即在各个测量组之间提供可验证的一致参考点存在困难。因此，大多数研究使用相对变形模型，其中坐标参考系统是框架不可或缺的一部分，从而限制了所收集数据的价值。在所描述的方法中，基准平面和坐标参考系统建立在框架外部，并且可以以可验证的方式在测量组之间重新建立。
