Schultz PA
Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
Phys Rev Lett. 2000 Feb 28;84(9):1942-5. doi: 10.1103/PhysRevLett.84.1942.
The conventional approach to treat charged defects in extended systems in first principles calculations is via the supercell approximation using a neutralizing jellium charge. I explicitly show that errors in the resulting electrostatic potential surface are comparable to a band gap energy in semiconductors, for cell sizes typically used in simulations. I present a method for eliminating divergence of the Coulomb potential in charged supercell calculations that correctly treats the electrostatic potential in the local vicinity of a charged defect, via a mixed boundary condition approach.
在第一性原理计算中,处理扩展系统中带电缺陷的传统方法是通过使用中和均匀电子气电荷的超胞近似。我明确表明,对于模拟中通常使用的晶胞尺寸,所得静电势面中的误差与半导体中的带隙能量相当。我提出了一种消除带电超胞计算中库仑势发散的方法,该方法通过混合边界条件方法正确处理带电缺陷局部附近的静电势。