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一种用于荧光显微镜色差测量与校正的高效算法。

An efficient algorithm for measurement and correction of chromatic aberrations in fluorescence microscopy.

作者信息

Kozubek M, Matula P

机构信息

Faculty of Informatics, Masaryk University, Botanicka 68a, CZ-60200 Brno, Czech Republic.

出版信息

J Microsc. 2000 Dec;200(Pt 3):206-17. doi: 10.1046/j.1365-2818.2000.00754.x.

Abstract

Even the best optical microscopes available on the market exhibit chromatic aberrations to some extent. In some types of study, chromatic aberrations of current optics cannot be neglected and a software correction is highly desirable. This paper describes a novel method of chromatic aberration measurement and software correction using sub-resolution bead imaging and computer image analysis. The method is quick, precise and enables the determination of both longitudinal and lateral chromatic aberrations. Correction function can be computed in about half an hour, including image acquisition. Using this approach, chromatic aberrations can be reduced to 10-20 nm laterally and 10-60 nm axially depending on the type of optical set-up. The method is especially suitable for fluorescence microscopy, where a limited number of wavelengths are observed.

摘要

即使是市面上最好的光学显微镜在某种程度上也会存在色差。在某些类型的研究中,当前光学系统的色差不容忽视,因此非常需要软件校正。本文描述了一种使用亚分辨率微珠成像和计算机图像分析来测量色差和进行软件校正的新方法。该方法快速、精确,能够确定纵向和横向色差。包括图像采集在内,校正函数大约半小时即可计算出来。使用这种方法,根据光学设置的类型,横向色差可降低到10 - 20纳米,轴向色差可降低到10 - 60纳米。该方法特别适用于荧光显微镜,因为在荧光显微镜中观察的波长数量有限。

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