DiMasi E, Tostmann H, Shpyrko O G, Huber P, Ocko B M, Pershan P S, Deutsch M, Berman L E
Departmetn of Physics, Brookhaven National Laboratory, Upton, NY 11973, USA.
Phys Rev Lett. 2001 Feb 19;86(8):1538-41. doi: 10.1103/PhysRevLett.86.1538.
Resonant x-ray reflectivity measurements from the surface of liquid Bi(22)In(78) find only a modest surface Bi enhancement, with 35 at. % Bi in the first atomic layer. This is in contrast to the Gibbs adsorption in all liquid alloys studied to date, which show surface segregation of a complete monolayer of the low surface tension component. This suggests that surface adsorption in Bi-In is dominated by attractive interactions that increase the number of Bi-In neighbors at the surface. These are the first measurements in which resonant x-ray scattering has been used to quantify compositional changes induced at a liquid alloy surface.
对液态Bi(22)In(78)表面进行的共振X射线反射率测量发现，表面Bi仅适度增强，在第一原子层中Bi的含量为35原子百分比。这与迄今为止研究的所有液态合金中的吉布斯吸附情况形成对比，后者显示低表面张力组分形成完整单分子层的表面偏析。这表明Bi-In中的表面吸附主要由吸引相互作用主导，这种相互作用增加了表面Bi-In近邻的数量。这些是首次使用共振X射线散射来量化液态合金表面诱导的成分变化的测量。
