Coumbaros J, Kirkbride K P, Klass G, Skinner W
Ian Wark Research Institute, University of South Australia, 5095, Mawson Lakes, Australia
Forensic Sci Int. 2001 Jun 1;119(1):72-81. doi: 10.1016/s0379-0738(00)00421-7.
The application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the characterisation of gunshot residue (GSR) from 0.22 caliber rimfire ammunition is reported. Results obtained by TOF-SIMS were compared with conventional scanning electron microscopy (SEM) studies. As could be expected, TOF-SIMS exhibited greater elemental sensitivity than SEM equipped with energy dispersive X-ray detection (SEM-EDX), and was also capable of detecting fragments characteristic of inorganic compounds. This preliminary study indicates that TOF-SIMS offers substantial potential for forensic GSR examinations as a complementary technique to SEM-EDX. In addition TOF-SIMS is applicable to the analysis of individual particles in the typical size range encountered in GSR casework.
报道了飞行时间二次离子质谱（TOF-SIMS）在表征0.22口径边缘发火弹药的枪击残留物（GSR）方面的应用。将TOF-SIMS获得的结果与传统扫描电子显微镜（SEM）研究结果进行了比较。不出所料，TOF-SIMS比配备能量色散X射线检测的扫描电子显微镜（SEM-EDX）表现出更高的元素灵敏度，并且还能够检测无机化合物特有的碎片。这项初步研究表明，TOF-SIMS作为SEM-EDX的补充技术，在法医GSR检验中具有巨大潜力。此外，TOF-SIMS适用于分析GSR案件工作中常见典型尺寸范围内的单个颗粒。
