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利用SK和Mo L边X射线吸收光谱法测定钼硫化合物中的金属-配体电荷分布。

S K- and Mo L-edge X-ray absorption spectroscopy to determine metal-ligand charge distribution in molybdenum-sulfur compounds.

作者信息

Rompel A, Cinco R M, Robblee J H, Latimer M J, McFarlane K L, Huang J, Walters M A, Yachandra V K

机构信息

Physical Biosciences Division, Lawrence Berkeley National Laboratory,CA 94720-5230, USA.

出版信息

J Synchrotron Radiat. 2001 Mar 1;8(Pt 2):1006-8. doi: 10.1107/s0909049500017702.

Abstract

Mo L-edge and S K-edge X-ray absorption spectroscopy were applied to investigate the charge distribution between Mo and S in a series of Mo thiolate compounds, which serve as amide-sulfur H-bonding models and exhibit different redox potentials arising from polar group effects and ligand hydrogen bonds near the redox center. For all oxidized complexes, the S K-edge spectra exhibit a thiolate-based pre-edge feature centered at 2470.2 eV and the inflection point oCCurs at 2472.0 eV. No intense pre-edge feature is observed in the spectra for the reduced Mo model compounds and the energy shift of the S K-edge position depends on the S-ligand. Correlations between ligand charge density and the redox potential of the Mo-S cores are observed.

摘要

采用钼L边和硫K边X射线吸收光谱法研究了一系列硫醇钼化合物中钼和硫之间的电荷分布,这些化合物作为酰胺-硫氢键模型,由于氧化还原中心附近的极性基团效应和配体氢键而呈现出不同的氧化还原电位。对于所有氧化态配合物,硫K边光谱显示出以2470.2 eV为中心的基于硫醇盐的前缘特征,拐点出现在2472.0 eV。在还原态钼模型化合物的光谱中未观察到强烈的前缘特征,硫K边位置的能量位移取决于硫配体。观察到配体电荷密度与钼-硫核的氧化还原电位之间的相关性。

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