Herrmann C F, Boland J J
Venable and Kenan Laboratories, Department of Chemistry, University of North Carolina, Chapel Hill, North Carolina 27599-3290, USA.
Phys Rev Lett. 2001 Sep 10;87(11):115503. doi: 10.1103/PhysRevLett.87.115503. Epub 2001 Aug 27.
Halogen etching of Si(100) surfaces has long been considered to involve the selective removal of atoms from an essentially static surface. Here we show that vacancy sites produced by etching are mobile at elevated temperature and rearrange to form features that were considered to be the direct products of etching. We demonstrate that the etch features observed at different temperatures are not due to different mechanisms. Rather, kinetic etch products formed at low temperatures are transformed into thermodynamically more stable features at higher temperatures.
长期以来,人们一直认为硅(100)表面的卤素蚀刻涉及从基本静态的表面选择性去除原子。在此我们表明,蚀刻产生的空位在高温下是可移动的,并重新排列形成被认为是蚀刻直接产物的特征。我们证明,在不同温度下观察到的蚀刻特征并非由于不同的机制。相反,低温下形成的动力学蚀刻产物在较高温度下转变为热力学上更稳定的特征。