Bohn J L, Nesbitt D J, Gallagher A
JILA, National Institute of Standards and Technology, and University of Colorado, Boulder, Colorado 80309-0440, USA.
J Opt Soc Am A Opt Image Sci Vis. 2001 Dec;18(12):2998-3006. doi: 10.1364/josaa.18.002998.
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orders of magnitude. This enhancement arises both from the antenna effect of the elongated probe and from a proximity effect when the probe is near the substrate surface and its image dipoles play a role.
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