Breschi L, Gobbi P, Falconi M, Ciavarelli L, Teti G, Mazzotti G
Istituto di Anatomia Umana, University of Bologna, Bologna, Italy.
J Dent. 2001 Sep;29(7):499-507. doi: 10.1016/s0300-5712(01)00047-1.
The aim of this study was to define the morphological bonding of the F2000 Restorative System (3M Dental Product) to enamel and dentin. For this purpose, high resolution scanning electron microscope (SEM) in conjunction with a tensile bond strength analysis was used to correlate the morphological findings to the bonding potential. Scotchbond 1 (SB1) adhesive system was utilized as a control.
Teeth were prepared in vivo and prepared as: (1) F2000 PA for 15s, (2) F2000 PA for 30s, (3) 35% phosphoric acid for 15s and SB1 and (4) 35% phosphoric acid for 30s and SB1. All teeth were then restored with the F2000 compomer restorative material, extracted, sectioned and analyzed by means of a field emission in-lens SEM (FEISEM). The conditioning/etching patterns of the two adhesive systems were also evaluated in vitro on dentin disks in order to show high resolution details of every single step of the bonding procedure.
FEISEM images showed a repetitive pattern of the enamel crystals with several microporosities after the 30s application of F2000 PA; moreover a good adaptation of the adhesive resin on the conditioned enamel was observable. FEISEM analysis of the dentin surface revealed no evidence of a smear layer after the application of F2000 PA for 30s. Residual smear plugs were partially obliterating the tubule orifices when F2000 PA was used, while they were completely absent after etching with 35% phosphoric acid. The total etching technique revealed open tubules and resin tags formation after the application of SB1.
The one step etching/priming/bonding procedure of the F2000 PA showed favorable results at ultra-structural level when applied on both the enamel and the dentin surface for 30s (as per manufacturers' instructions), but the bond strength analysis showed higher values of bonding of the F2000 compomer when the SB1 adhesive agent (after etching with 35% phosphoric acid) was used (7.7+/-2.2 vs 19.0+/-4.4MPa).
本研究旨在确定F2000修复系统（3M牙科产品）与牙釉质和牙本质的形态学结合情况。为此，使用高分辨率扫描电子显微镜（SEM）结合拉伸粘结强度分析，将形态学发现与粘结潜力相关联。采用Scotchbond 1（SB1）粘结系统作为对照。
在体内对牙齿进行预备，并分为以下几种情况：（1）用F2000 PA处理15秒；（2）用F2000 PA处理30秒；（3）用35%磷酸处理15秒并使用SB1；（4）用35%磷酸处理30秒并使用SB1。然后用F2000复合树脂修复材料对所有牙齿进行修复，拔牙后切片，通过场发射内透镜扫描电子显微镜（FEISEM）进行分析。还在体外对牙本质盘上的两种粘结系统的预处理/蚀刻模式进行了评估，以显示粘结过程中每个步骤的高分辨率细节。
FEISEM图像显示，在使用F2000 PA 30秒后，牙釉质晶体呈现出带有多个微孔的重复模式；此外，可观察到粘结树脂在预处理后的牙釉质上有良好的适应性。对牙本质表面的FEISEM分析显示，在使用F2000 PA 30秒后没有玷污层的迹象。使用F2000 PA时，残留的玷污栓部分堵塞了牙本质小管口，而用35%磷酸蚀刻后则完全没有玷污栓。使用SB1后，全蚀刻技术显示出开放的牙本质小管和树脂突的形成。
按照制造商的说明，F2000 PA的一步蚀刻/底漆/粘结程序在牙釉质和牙本质表面均应用30秒时，在超微结构水平上显示出良好的效果，但粘结强度分析显示，使用SB1粘结剂（用35%磷酸蚀刻后）时，F2000复合树脂的粘结值更高（7.7±2.2对19.0±4.4MPa）。
