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外部孔道塌陷作为Kv4.3钾离子通道的一种失活机制。

External pore collapse as an inactivation mechanism for Kv4.3 K+ channels.

作者信息

Eghbali M, Olcese R, Zarei M M, Toro L, Stefani E

机构信息

Department of Anesthesiology, David Geffen School of Medicine, University of California Los Angeles, Los Angeles, CA 90095-7155, USA.

出版信息

J Membr Biol. 2002 Jul 1;188(1):73-86. doi: 10.1007/s00232-001-0173-3.

Abstract

Kv4 channels are thought to lack a C-type inactivation mechanism (collapse of the external pore) and to inactivate as a result of a concerted action of cytoplasmic regions of the channel. To investigate whether Kv4 channels have outer pore conformational changes during the inactivation process, the inactivation properties of Kv4.3 were characterized in 0 mM and in 2 mM external K+ in whole-cell voltage-clamp experiments. Removal of external K+ increased the inactivation rates and favored cumulative inactivation by repetitive stimulation. The reduction in current amplitude during repetitive stimulation and the faster inactivation rates in 0 mM external K+ were not due to changes in the voltage dependence of channel opening or to internal K+ depletion. The extent of the collapse of the K+ conductance upon removal of external K+ was more pronounced in NMG+-than in Na+-containing solutions. The reduction in the current amplitude during cumulative inactivation by repetitive stimulation is not associated with kinetic changes, suggesting that it is due to a diminished number of functional channels with unchanged gating properties. These observations meet the criteria for a typical C-type inactivation, as removal of external K+ destabilizes the conducting state, leading to the collapse of the pore. A tentative model is presented, in which K+ bound to high-affinity K+-binding sites in the selectivity filter destabilizes an outer neighboring K+ modulatory site that is saturated at approximately 2 mM external K+. We conclude that Kv4 channels have a C-type inactivation mechanism and that previously reported alterations in the inactivation rates after N- and C- termini mutagenesis may arise from secondary changes in the electrostatic interactions between K+-binding sites in the selectivity filter and the neighboring K+-modulatory site, that would result in changes in its K+ occupancy.

摘要

人们认为Kv4通道缺乏C型失活机制(外部孔道塌陷),而是由于通道胞质区域的协同作用而失活。为了研究Kv4通道在失活过程中是否存在外孔构象变化,在全细胞电压钳实验中,对Kv4.3在外部K⁺浓度为0 mM和2 mM时的失活特性进行了表征。去除外部K⁺会增加失活速率,并有利于通过重复刺激实现累积失活。重复刺激期间电流幅度的降低以及在外部K⁺浓度为0 mM时更快的失活速率,并非由于通道开放的电压依赖性变化或内部K⁺耗尽所致。去除外部K⁺后K⁺电导的塌陷程度在含NMG⁺的溶液中比在含Na⁺的溶液中更明显。重复刺激导致累积失活期间电流幅度的降低与动力学变化无关,这表明这是由于具有不变门控特性的功能性通道数量减少所致。这些观察结果符合典型C型失活的标准,因为去除外部K⁺会使传导状态不稳定,导致孔道塌陷。本文提出了一个初步模型,其中与选择性过滤器中高亲和力K⁺结合位点结合的K⁺会使一个外部相邻的K⁺调节位点不稳定,该位点在外部K⁺浓度约为2 mM时饱和。我们得出结论,Kv4通道具有C型失活机制,并且先前报道的N端和C端诱变后失活速率的改变可能源于选择性过滤器中K⁺结合位点与相邻K⁺调节位点之间静电相互作用的继发性变化,这将导致其K⁺占据情况的改变。

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