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薄液膜的X射线散射:超越谐波近似

X-ray scattering of thin liquid films: beyond the harmonic approximation.

作者信息

Li Ming, Schlossman Mark L

机构信息

Institute of Physics and Center for Condensed Matter Physics, Chinese Academy of Sciences, Beijing 100080, People's Republic of China.

出版信息

Phys Rev E Stat Nonlin Soft Matter Phys. 2002 Jun;65(6 Pt 1):061608. doi: 10.1103/PhysRevE.65.061608. Epub 2002 Jun 25.

DOI:10.1103/PhysRevE.65.061608
PMID:12188744
Abstract

We calculate the x-ray scattering from coupled capillary fluctuations of thin liquid films, taking into account an asymmetric interfacial interaction potential. Harmonic expansion of the potential around its minimum produces the well-known Kiessig fringes in both specular reflectivity and longitudinal diffuse scattering. The addition of a cubic term to the expansion, representing the asymmetry, leads to q(z)-dependent changes of the modulation period of the Kiessig fringes. The cubic term produces a relative phase shift between the interference fringes of the specular reflectivity and the off-specular longitudinal diffuse scattering. It is suggested that these effects may be used to estimate, via x-ray scattering, the interfacial potential of thin liquid films.

摘要

我们计算了考虑不对称界面相互作用势时,薄液膜耦合毛细管涨落的X射线散射。势在其最小值附近的谐波展开在镜面反射率和纵向漫散射中都产生了著名的基西希条纹。在展开式中加入一个表示不对称性的三次项,会导致基西希条纹调制周期随q(z)变化。三次项在镜面反射率的干涉条纹和离镜面纵向漫散射之间产生相对相移。有人提出,这些效应可通过X射线散射用于估计薄液膜的界面势。

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