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树脂改性玻璃离子水门汀的表面质地:修整/抛光时间的影响

Surface texture of resin-modified glass ionomer cements: effects of finishing/polishing time.

作者信息

Yap A U J, Ong S B, Yap W Y, Tan W S, Yeo J C

机构信息

Department of Restorative Dentistry, Faculty of Dentistry, National University of Singapore, Republic of Singapore.

出版信息

Oper Dent. 2002 Sep-Oct;27(5):462-7.

Abstract

This study compared the surface texture of resin-modified glass ionomer cements after immediate and delayed finishing with different finishing/polishing systems. Class V preparations were made on the buccal and lingual/palatal surfaces of 64 freshly extracted teeth. The cavities on each tooth were restored with Fuji II LC (GC) and Photac-Fil Quick (3M-ESPE) according to manufacturers' instructions. Immediately after light-polymerization, gross finishing was done with 8-fluted tungsten carbide burs. The teeth were then randomly divided into four groups of 16 teeth. Half of the teeth in each group were finished immediately, while the remaining half were finished after one-week storage in distilled water at 37 degrees C. The following finishing/polishing systems were employed: (a) Robot Carbides; (b) Super-Snap system; (c) OneGloss and (d) CompoSite Polishers. The mean surface roughness (microm; n=8) in vertical (RaV) and horizontal (RaH) axis was measured using a profilometer. Data was subjected to ANOVA/Scheffe's tests and Independent Samples t-test at significance level 0.05. Ra values were generally lower in both vertical and horizontal axis with delayed finishing/polishing. Although significant differences in RaV and RaH values were observed among several systems with immediate finishing/polishing, only one (Fuji II LC: RaH - Super-Snap < Robot Carbides) was observed with delayed finishing.

摘要

本研究比较了使用不同的修整/抛光系统立即修整和延迟修整后树脂改性玻璃离子水门汀的表面纹理。在64颗新鲜拔除的牙齿的颊面以及舌面/腭面制备V类洞。按照制造商的说明,用Fuji II LC(GC公司)和Photac-Fil Quick(3M-ESPE公司)修复每颗牙齿上的窝洞。光固化后立即用8刃硬质合金车针进行初步修整。然后将牙齿随机分为四组,每组16颗。每组中一半的牙齿立即进行修整,而其余一半在37℃蒸馏水中储存一周后进行修整。采用了以下修整/抛光系统:(a)Robot Carbides;(b)Super-Snap系统;(c)OneGloss和(d)复合抛光器。使用轮廓仪测量垂直(RaV)和水平(RaH)轴上的平均表面粗糙度(微米;n = 8)。数据进行方差分析/谢费检验以及显著性水平为0.05的独立样本t检验。延迟修整/抛光时,垂直和水平轴上的Ra值通常较低。虽然在立即修整/抛光的几个系统之间观察到RaV和RaH值存在显著差异,但延迟修整时仅观察到一处差异(Fuji II LC:RaH - Super-Snap < Robot Carbides)。

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