Joy David C.
Oak Ridge National Laboratory, Oak Ridge, TN 37831.
Microsc Microanal. 2001 Mar;7(2):159-167.
Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the quality and quantity of data available is poor, and that there are major gaps remaining to be filled.
定量X射线微分析需要使用许多与电子束和样品相互作用相关的基本常数。本文研究了在电子阻止本领、X射线电离截面、X射线荧光产额和电子背散射产额等特定领域中，我们对这些常数的当前认识状态。结果发现，在每种情况下，可用数据的质量和数量都很差，并且仍有重大空白有待填补。
