Haefliger D, Stemmer A
Nanotechnology Group, Swiss Federal Institute of Technology Zurich, Tannenstrasse 3, CH-8092 Zurich, Switzerland.
J Microsc. 2003 Mar;209(Pt 3):150-4. doi: 10.1046/j.1365-2818.2003.01116.x.
A simple, one-step process to fabricate high-quality apertures for scanning near-field optical microscope probes based on aluminium-coated silicon nitride cantilevers is presented. A thin evanescent optical field at a glass-water interface was used to heat the aluminium at the tip apex due to light absorption. The heat induced a breakdown of the passivating oxide layer and local corrosion of the metal, which selectively exposed the front-most part of the probe tip from the aluminium. Apertures with a protruding silicon nitride tip up to 72 nm in height were fabricated. The height of the protrusion was controlled by the extent of the evanescent field, whereas the diameter depended on the geometry of the probe substrate. The corrosion process proved to be self-terminating, yielding highly reproducible tip heights. Near-field optical resolution in a transmission mode of 85 nm was demonstrated.
提出了一种基于涂铝氮化硅悬臂梁为扫描近场光学显微镜探针制造高质量孔径的简单单步工艺。由于光吸收,玻璃 - 水界面处的薄倏逝光场用于加热探针尖端的铝。热量导致钝化氧化层击穿和金属的局部腐蚀,从而有选择地使探针尖端的最前端部分从铝中暴露出来。制造出了高度高达72 nm的突出氮化硅尖端的孔径。突出部分的高度由倏逝场的范围控制,而直径则取决于探针基板的几何形状。腐蚀过程被证明是自终止的,产生了高度可重复的尖端高度。在传输模式下展示了85 nm的近场光学分辨率。