Kornelis W, Biegert J, Tisch J W G, Nisoli M, Sansone G, Vozzi C, De Silvestri S, Keller U
Department of Physics, Institute of Quantum Electronics, Swiss Federal Institute of Technology, Zurich, CH 8093, Switzerland.
Opt Lett. 2003 Feb 15;28(4):281-3. doi: 10.1364/ol.28.000281.
We describe a method of characterizing ultrashort optical pulses that is based on the technique of spectral phase interferometry for direct electric-field reconstruction and is capable of simultaneously measuring the amplitude and the phase of the electric field of a sub-10-fs pulse at kilohertz acquisition rates on a single-shot basis. Use of this technique results in a dramatic increase (>50x) in acquisition rate compared with that of existing diagnostics for full E-field characterization and opens the door to a range of new experiments in which shot-to-shot phase and amplitude fluctuations are studied at kilohertz rates.
