Murguia J. S., Urias Jesus
IICO, UASLP, A. Obregon 64, 78000 San Luis Potosi, SLP, Mexico.
Chaos. 2001 Dec;11(4):858-863. doi: 10.1063/1.1423282.
It is proved that the multifractal characterizations of diametrically regular measures that are provided by the wavelet and by the Hentschel-Procaccia formalisms are identical. (c) 2001 American Institute of Physics.
结果表明,由小波和亨切尔 - 普罗卡西亚形式体系给出的径向正则测度的多重分形特征是相同的。(c)2001美国物理研究所。