Sander B, Golas M M, Stark H
Max Planck Institute for Biophysical Chemistry, Am Fassberg 11, 37077 Göttingen, Germany.
J Struct Biol. 2003 Jun;142(3):392-401. doi: 10.1016/s1047-8477(03)00072-8.
Three-dimensional electron cryomicroscopy of randomly oriented single particles is a method that is suitable for the determination of three-dimensional structures of macromolecular complexes at molecular resolution. However, the electron-microscopical projection images are modulated by a contrast transfer function (CTF) that prevents the calculation of three-dimensional reconstructions of biological complexes at high resolution from uncorrected images. We describe here an automated method for the accurate determination and correction of the CTF parameters defocus, twofold astigmatism and amplitude-contrast proportion from single-particle images. At the same time, the method allows the frequency-dependent signal decrease (B factor) and the non-convoluted background signal to be estimated. The method involves the classification of the power spectra of single-particle images into groups with similar CTF parameters; this is done by multivariate statistical analysis (MSA) and hierarchically ascending classification (HAC). Averaging over several power spectra generates class averages with enhanced signal-to-noise ratios. The correct CTF parameters can be deduced from these class averages by applying an iterative correlation procedure with theoretical CTF functions; they are then used to correct the raw images. Furthermore, the method enables the tilt axis of the sample holder to be determined and allows the elimination of individual poor-quality images that show high drift or charging effects.
随机取向单颗粒的三维电子冷冻显微镜技术是一种适用于在分子分辨率下测定大分子复合物三维结构的方法。然而,电子显微镜投影图像会受到对比度传递函数(CTF)的调制,这使得无法从未经校正的图像中计算出生物复合物的高分辨率三维重建。我们在此描述一种自动方法,用于从单颗粒图像中准确测定和校正CTF参数,包括散焦、二次像散和幅度对比度比例。同时,该方法还能估计频率依赖性信号衰减(B因子)和非卷积背景信号。该方法包括将单颗粒图像的功率谱分类为具有相似CTF参数的组;这通过多元统计分析(MSA)和层次上升分类(HAC)来完成。对多个功率谱进行平均可生成信噪比增强的类平均图像。通过将理论CTF函数应用于迭代相关程序,可以从这些类平均图像中推导出正确的CTF参数;然后将其用于校正原始图像。此外,该方法能够确定样品台的倾斜轴,并允许剔除显示出高漂移或充电效应的个别质量较差的图像。