Marcus Matthew S, Eriksson M A, Sasaki Darryl Y, Carpick Robert W
Physics Department, University of Wisconsin-Madison, Madison, WI, USA.
Ultramicroscopy. 2003 Oct-Nov;97(1-4):145-50. doi: 10.1016/S0304-3991(03)00039-1.
Contrast in the phase response of intermittent-contact atomic force microscopy (IC-AFM) reveals in-plane structural and mechanical properties of polymer monolayers. This result is unexpected, as IC-AFM has previously only been considered as a probe of out-of-plane properties. Until now, AFM measurements of nanoscale in-plane properties have employed contact mode techniques. In-plane property measurements are possible with intermittent contact AFM because there is a small but significant component of tip motion parallel to the sample surface. This in-plane component of tip displacement is virtually universal in AFM, implying that oscillating-tip techniques generally are sensitive to in-plane material properties. We present a simple Hertzian model of intermittent-contact AFM that includes such an in-plane displacement.
间歇接触原子力显微镜（IC-AFM）相位响应中的对比度揭示了聚合物单层的面内结构和力学性能。这一结果出人意料，因为IC-AFM此前仅被视为面外性能的探测手段。到目前为止，纳米级面内性能的原子力显微镜测量采用的是接触模式技术。利用间歇接触原子力显微镜进行面内性能测量是可行的，因为存在一个与样品表面平行的、虽小但显著的针尖运动分量。针尖位移的这个面内分量在原子力显微镜中几乎普遍存在，这意味着振荡针尖技术通常对面内材料性能敏感。我们提出了一个包含这种面内位移的间歇接触原子力显微镜的简单赫兹模型。
