A study of topographic effects on chemical force microscopy using adhesive force mapping.

Origins of peak broadening in a histogram of measured adhesive forces were studied. The adhesive forces were measured in water by pulsed-force-mode atomic force microscopy. One sample was prepared by a microcontact printing method on a sputtered gold film with fine grains, on which CH(3)- and COOH-terminated regions were produced. Gold surfaces of other samples were chemically modified homogeneously by a self-assembling method in solution. Their surfaces were, however, topographically different, i.e. (i) an Au(111)-terrace-rich gold film prepared by vacuum vapor deposition at high temperature and (ii) sputtered gold films on cover glass with different grain sizes obtained by different deposition time. These sample surfaces and the probe tip surface were all CH(3)-terminated by self-assembled monolayers with CH(3)(CH(2))(19)SH. The main origin of peak broadening in the histogram was the topographic effect. Namely, the change in the grain sizes and the change in multiplicity of contacts between the tip and convexities of the grains resulted in the distribution of the observed adhesive forces.