Xie Qiu-you, Liu Xiao-jia, Li Wei-ping, Lü Qing-wen
Department of Neurology, Nanfang Hospital, The First Military Medical University, Guangzhou 510515, China.
Zhonghua Nei Ke Za Zhi. 2003 Mar;42(3):173-6.
To investigate the relation between the location of brain damage and Chinese agraphia.
Aphasia Battery of Chinese (ABC) and Chinese Agraphia Battery (CAB) were used to examine the ability of oral language and writing. Different types of aphasia and agraphia were detected. Computerized image-processing technology was used to standardize and reconstruct the skull CT/MRI images. The results substracted from the normal controls were shown directly.
48 patients had lesions on the left brain among them 30 were aphasic and 32 were agraphic. 15 had lesions on the right brain, among them 3 were aphasic and agraphic. The image-processing results showed that the nidi of aphasic agraphia located on the left deep albae of frontal and parietal lobe, the nidi of persistent agraphia located on the posterior parts of the left 1st and 2nd gyrus of frontal lobe and the nidi of mirror agraphia were dispersed near the left basal ganglion and thalamus.
It is found that there is a relationship between Chinese agraphia and the location of brain damage. Some parts may be responsible for some special writing ability.
探讨脑损害部位与汉语失写症之间的关系。
采用汉语失语症成套测验（ABC）和汉语失写症成套测验（CAB）对口语和书写能力进行检查，检测不同类型的失语症和失写症。运用计算机图像处理技术对头颅CT/MRI图像进行标准化和重建，直接显示与正常对照相减后的结果。
48例患者左侧脑区有病变，其中30例失语，32例失写。15例右侧脑区有病变，其中3例失语且失写。图像处理结果显示，失语性失写病灶位于左侧额顶叶深部白质，持续性失写病灶位于左侧额叶第一、二回后部，镜像性失写病灶散在于左侧基底节和丘脑附近。
发现汉语失写症与脑损害部位之间存在关系，某些部位可能负责某些特殊的书写能力。
