Kimoto Koji, Matsui Yoshio
Advanced Materials Laboratory, National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki, 305-0044, Japan.
Ultramicroscopy. 2003 Sep;96(3-4):335-42. doi: 10.1016/S0304-3991(03)00099-8.
Phase contrast formed by inelastically scattered electrons in a crystal has been investigated using spatially resolved EELS, which enables simultaneous observation of lattice fringes formed by electrons of various energy losses. Lattice fringes produced by low-loss electrons overlap on an elastic TEM image like Fourier images. This means that the exit wave is preserved in low-loss scattering. Similar Fourier images occur for electrons suffering core-losses in the range 50-400 eV, which indicates delocalization and spatial coherence in those core-loss scattering events. The spatial coherence of inelastically scattered electrons is estimated from the focus dependence of energy-filtered lattice fringe contrast. Spatial coherence widths shorten with increasing energy-loss, and their energy-loss dependence is similar to diffraction errors derived from the characteristic angle for inelastic scattering.
利用空间分辨电子能量损失谱(EELS)研究了晶体中非弹性散射电子形成的相位衬度,该技术能够同时观察由各种能量损失的电子形成的晶格条纹。低损失电子产生的晶格条纹像傅里叶图像一样重叠在弹性透射电镜图像上。这意味着出射波在低损失散射中得以保留。对于能量损失在50 - 400 eV范围内遭受芯损失的电子,也会出现类似的傅里叶图像,这表明在这些芯损失散射事件中存在离域和空间相干性。非弹性散射电子的空间相干性是根据能量过滤晶格条纹对比度对焦点的依赖性来估计的。空间相干宽度随着能量损失的增加而缩短,并且它们的能量损失依赖性类似于由非弹性散射特征角得出的衍射误差。