Herring R A
Center for Advanced Materials and Related Technology, Department of Mechanical Engineering, University of Victoria, STN CSC, Victoria, BC, Canada, V8N 4T6.
Ultramicroscopy. 2005 Oct;104(3-4):261-70. doi: 10.1016/j.ultramic.2005.05.002.
A method of energy-filtered electron holography is described where any two electron-diffracted beams can be interfered using an electron biprism. A Gatan image filter is used to select the energy loss of the electrons produced in the holograms. Gallium arsenide is used as the TEM specimen. This method of microscopy confirms that fringes extending beyond a limiting aperture were due to inelastically scattered electrons and specifically electrons scattered from the bulk plasmon. The degree of coherence of the zero-loss and energy-loss electrons were high and measured to be approximately 0.3, which was maintained even for the high energy-loss electrons up to 100 eV. Future systematic studies using this method should help understand the Stobbs factor and contribute to the development of quantitative high-resolution electron microscopy.
描述了一种能量过滤电子全息术方法,其中任意两束电子衍射束可通过电子双棱镜进行干涉。使用加坦图像滤波器来选择全息图中产生的电子的能量损失。砷化镓用作透射电子显微镜(TEM)样品。这种显微镜方法证实,延伸超过限制孔径的条纹是由于非弹性散射电子,特别是从体等离子体散射的电子所致。零损失和能量损失电子的相干度很高,测量值约为0.3,即使对于高达100 eV的高能量损失电子也能保持。使用该方法的未来系统研究应有助于理解斯托布斯因子,并有助于定量高分辨率电子显微镜的发展。