Fairén A, Smith-Fernández A
Instituto Cajal, CSIC, Madrid, Spain.
Microsc Res Tech. 1992 Dec 1;23(4):289-305. doi: 10.1002/jemt.1070230405.
The Golgi-electron microscope technique has opened new avenues to explore the synaptic organization of the brain. In this article, we shall discuss basic methodological principles necessary to analyze axonal arborizations with this combined technique. To illustrate the applications of the method, we shall review the forms and distribution of the synapses in which the axonal arborizations of local cortical interneurons engage.
高尔基电子显微镜技术为探索大脑的突触组织开辟了新途径。在本文中,我们将讨论使用这种联合技术分析轴突分支所需的基本方法学原理。为了说明该方法的应用,我们将回顾局部皮质中间神经元的轴突分支所形成的突触的形式和分布。