Weber H P, Buser D, Fiorellini J P, Williams R C
Department of Periodontology, Harvard School of Dental Medicine, Boston.
Clin Oral Implants Res. 1992 Dec;3(4):181-8. doi: 10.1034/j.1600-0501.1992.030405.x.
Several parameters have been described to determine success or failure in long-term evaluations of dental implants. One of these parameters is the observation of changes in peri-implant bone levels. Studies on submerged implants have analyzed the bone level changes in the pre- and post-loading phases. No such data exist for intentionally nonsubmerged implants. The purposes of this study were: (1) to test the applicability and reproducibility of a simple computer-assisted method in the evaluation of changes in peri-implant bone levels; (2) to establish a baseline for the longterm radiographic follow-up; and (3) to evaluate changes in crestal bone levels adjacent to nonsubmerged ITI implants between the 1-year and 2-year examination. Standardized periapical radiographs were obtained from 80 implants at the 1-year and 2-year follow-up examinations after their placement. The implants were located in different jaw areas of 55 patients and supported single crowns or short-span fixed partial dentures. For each implant, the distance from implant shoulder to first crestal bone contact (DIB) was measured at the proximal surfaces with a digitizer/computer assembly. Statistically significant greater mean DIB were found at the 1-year (baseline) evaluation for: (1) maxillary sites overall (4.10 x 1.02 mm (SD)) compared with mandibular sites overall (3.61 +/- 1.03 mm); (2) maxillary anterior sites (4.08 +/- 0.97 mm) compared with mandibular posterior sites (3.60 +/- 1.05 mm); and (3) maxillary posterior sites (4.13 +/- 1.12 mm) compared with mandibular posterior sites. No statistically significant changes in DIB occurred in any of the jaw locations between the 1-year and 2-year evaluations.(ABSTRACT TRUNCATED AT 250 WORDS)
在牙种植体的长期评估中,已经描述了几个参数来确定成功或失败。这些参数之一是观察种植体周围骨水平的变化。关于潜入式种植体的研究分析了加载前和加载后阶段的骨水平变化。对于有意非潜入式种植体,不存在此类数据。本研究的目的是:(1)测试一种简单的计算机辅助方法在评估种植体周围骨水平变化中的适用性和可重复性;(2)建立长期放射学随访的基线;(3)评估1年和2年检查之间非潜入式ITI种植体相邻的嵴顶骨水平变化。在80颗种植体植入后1年和2年的随访检查中,获得了标准化的根尖片。这些种植体位于55名患者的不同颌骨区域,支持单冠或短跨度固定局部义齿。对于每个种植体,使用数字化仪/计算机组件在近端表面测量从种植体肩部到第一个嵴顶骨接触点(DIB)的距离。在1年(基线)评估中发现,以下情况的平均DIB在统计学上有显著差异:(1)上颌部位总体(4.10×1.02 mm(标准差))与下颌部位总体(3.61±1.03 mm)相比;(2)上颌前部部位(4.08±0.97 mm)与下颌后部部位(3.60±1.05 mm)相比;(3)上颌后部部位(4.13±1.12 mm)与下颌后部部位相比。在1年和2年评估之间,任何颌骨位置的DIB均未发生统计学上的显著变化。(摘要截断于250字)