Wang J, Bedzyk M J, Caffrey M
Department of Chemistry, Ohio State University, Columbus 43210.
Science. 1992 Oct 30;258(5083):775-8. doi: 10.1126/science.1439784.
An x-ray resonance effect in an organic thin film on an x-ray reflecting mirror is reported. The resonance effect is the result of interference between reflected and refracted x-rays at the air-organic thin film interface and occurs at incident angles slightly above the critical angle of the film. In excellent agreement with theory, the primary resonant x-ray electric field that is confined in the organic thin film is approximately 20 times as intense as the electric field of the incident beam when measured at a position close to the center of the film. Resonance-enhanced x-rays can be used to characterize the internal structure of Langmuir-Blodgett thin film membranes. This effect may also find use in x-ray-based thin film devices and in the structural analysis of adlayers and surfaces that have thus far proved difficult, if not impossible, to study because of sensitivity limitations.
报道了在X射线反射镜上的有机薄膜中的X射线共振效应。该共振效应是空气 - 有机薄膜界面处反射和折射的X射线之间干涉的结果，并且在略高于薄膜临界角的入射角处发生。与理论高度一致，当在靠近薄膜中心的位置测量时，局限于有机薄膜中的初级共振X射线电场强度约为入射光束电场强度的20倍。共振增强的X射线可用于表征朗缪尔 - 布洛杰特薄膜膜的内部结构。这种效应也可能用于基于X射线的薄膜器件以及迄今为止由于灵敏度限制而被证明难以（如果不是不可能）研究的吸附层和表面的结构分析。
