Miralbés Carlos
Harinera La Meta S.A. Pol. Industrial El Segre, C/Industria Parc. 204-R, 25191, Lleida, Spain.
J Agric Food Chem. 2003 Oct 8;51(21):6335-9. doi: 10.1021/jf034235g.
Moisture, protein, wet gluten, dry gluten, and alveograph parameters (W, P, and P/L) of whole wheat grown in different countries around the world were analyzed using near infrared (NIR) transmittance spectroscopy. Modified partial least squares on NIR spectra (850-1048.2 nm) were developed for each constituent or physical property. The best models were obtained for protein, moisture, wet gluten, and dry gluten with r(2) = 0.99, 0.99, 0.95, and 0.96, respectively. Initial alveograph NIR models proposed for all wheat samples did not perform well. However, when wheat samples were divided in two groups depending on W (deformation energy) values, NIR models were highly improved, showing enough prediction accuracy for screening wheat at the receiving stage at mills or elevators.
利用近红外(NIR)透射光谱法分析了世界不同国家种植的全麦的水分、蛋白质、湿面筋、干面筋和粉质仪参数(W、P和P/L)。针对每种成分或物理特性,建立了近红外光谱(850 - 1048.2 nm)的改进偏最小二乘法模型。蛋白质、水分、湿面筋和干面筋的最佳模型分别获得了r(2) = 0.99、0.99、0.95和0.96。最初针对所有小麦样品提出的粉质仪近红外模型效果不佳。然而,当根据W(变形能量)值将小麦样品分为两组时,近红外模型得到了显著改进,显示出在面粉厂或粮库接收阶段筛选小麦时有足够的预测准确性。