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由价电子浓度驱动的相变:调控Gd5GaxGe4-x中的板间键距

Phase transformation driven by valence electron concentration: tuning interslab bond distances in Gd5GaxGe4-x.

作者信息

Mozharivskyj Yurij, Choe Wonyoung, Pecharsky Alexandra O, Miller Gordon J

机构信息

Ames Laboratory, Iowa State University, Ames, Iowa 500110, USA.

出版信息

J Am Chem Soc. 2003 Dec 10;125(49):15183-90. doi: 10.1021/ja037649z.

DOI:10.1021/ja037649z
PMID:14653753
Abstract

X-ray single crystal and powder diffraction studies on the Gd(5)Ga(x)()Ge(4)(-)(x)() system with 0 < or = x < or = 2.2 reveal dependence of interslab T-T dimer distances and crystal structures themselves on valence electron concentration (T is a mixture of Ga and Ge atoms). While the Gd(5)Ga(x)()Ge(4)(-)(x)() phases with 0 < or = x < or = 0.6 and valence electron concentration of 30.4-31 e(-)/formula crystallize with the Sm(5)Ge(4)-type structure, in which all interslab T-T dimers are broken (distances exceeding 3.4 A), the phases with 1 < or = x < or = 2.2 and valence electron concentration of 28.8-30 e-/formula adopt the Pu(5)Rh(4)- or Gd(5)Si(4)-type structures with T-T dimers between the slabs. An orthorhombic Pu(5)Rh(4)-type structure, which is intermediate between the Gd(5)Si(4)- and Sm(5)Ge(4)-type structures, has been identified for the Gd(5)GaGe(3) composition. Tight-binding linear-muffin-tin-orbital calculations show that substitution of three-valent Ga by four-valent Ge leads to larger population of the antibonding states within the dimers and, thus, to dimer stretching and eventually to dimer cleavage.

摘要

对0≤x≤2.2的Gd(5)Ga(x)()Ge(4)( - )(x)()体系进行的X射线单晶和粉末衍射研究表明,板间T - T二聚体距离和晶体结构本身对价电子浓度有依赖性(T是Ga和Ge原子的混合物)。当0≤x≤0.6且价电子浓度为30.4 - 31 e(-)/化学式单位的Gd(5)Ga(x)()Ge(4)( - )(x)()相以Sm(5)Ge(4)型结构结晶时,其中所有板间T - T二聚体均断裂(距离超过3.4 Å),而1≤x≤2.2且价电子浓度为28.8 - 30 e-/化学式单位的相采用板间具有T - T二聚体的Pu(5)Rh(4) - 或Gd(5)Si(4)型结构。已确定Gd(5)GaGe(3)组成具有正交晶系的Pu(5)Rh(4)型结构,它介于Gd(5)Si(4) - 和Sm(5)Ge(4)型结构之间。紧束缚线性 muffin - tin轨道计算表明,用四价Ge取代三价Ga会导致二聚体内反键态的占据数增加,从而导致二聚体拉伸并最终导致二聚体断裂。

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