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扫描电化学显微镜的表面分析:分辨率研究及其在聚合物样品中的应用。

Surface analysis by scanning electrochemical microscopy: resolution studies and applications to polymer samples.

作者信息

Borgwarth K, Ricken C, Ebling D G, Heinze J

机构信息

Institut für Physikalische Chemie Albert-Ludwigs-Universität Albertstrasse 21 und Freiburger Materialforschungszentrum, Albert-Ludwigs-Universität, Stefan-Meier-Strasse 21, D-79104, Freiburg, Germany.

出版信息

Anal Bioanal Chem. 1996 Sep;356(3-4):288-94. doi: 10.1007/s0021663560288.

DOI:10.1007/s0021663560288
PMID:15048371
Abstract

Resolution studies of scanning electrochemical microscopy (SECM) have been performed in the feedback mode and in the generator/collector mode at circular model structures. A quantitative correlation of the loss in resolution and the increase in distance between tip and sample is found. Measuring a band electrode of just 500 nm width, the high sensitivity of the SECM in identifying chemically active sites is proven. Applied to polymer samples, the chemical composition was determined in the feedback mode at high lateral resolution. The difference in electrical conductivity allows one to distinguish between doped and undoped parts of a polyaniline film. By scanning above a blend consisting of polypyrrole and polypropylene, a map of the local chemical composition was obtained. In this context, the influence of the tip overpotential on the image is discussed.

摘要

已在圆形模型结构上以反馈模式和发生器/收集器模式进行了扫描电化学显微镜(SECM)的分辨率研究。发现分辨率损失与尖端和样品之间距离增加之间存在定量相关性。通过测量宽度仅为500 nm的带状电极,证明了SECM在识别化学活性位点方面的高灵敏度。应用于聚合物样品时,在反馈模式下以高横向分辨率测定了化学成分。电导率的差异使人们能够区分聚苯胺薄膜的掺杂部分和未掺杂部分。通过在由聚吡咯和聚丙烯组成的共混物上方扫描,获得了局部化学成分图。在此背景下,讨论了尖端过电位对图像的影响。

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