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通过低能正电子碰撞测量铜K壳层和银L壳层的电离截面。

Measurement of Cu K-shell and Ag L-shell ionization cross sections by low-energy positron impact.

作者信息

Nagashima Yasuyuki, Saito Fuminori, Itoh Yoshiko, Goto Akira, Hyodo Toshio

机构信息

Institute of Physics, Graduate School of Arts and Sciences, University of Tokyo, 3-8-1 Komaba, Meguro-ku, Tokyo 153-8902, Japan.

出版信息

Phys Rev Lett. 2004 Jun 4;92(22):223201. doi: 10.1103/PhysRevLett.92.223201. Epub 2004 Jun 3.

DOI:10.1103/PhysRevLett.92.223201
PMID:15245220
Abstract

Inner shell ionization cross sections by low-energy positron impact have been measured. Development of an x-ray detector with thin Si(Li) crystals has enabled the first measurements of the absolute cross sections for the positron impacts in the energy range below 30 keV. Threshold behavior of the measured cross sections for the Cu K shell and Ag L shell are compared with the theoretical results of Gryzinski and Kowalski [Phys. Lett. A 183, 196 (1993)]] and Khare and Wadehra [Can. J. Phys. 74, 376 (1996)]]. Good agreement has been found for the Cu K shell, while the experimental values for the Ag L shell were found to be smaller than the corresponding theoretical results.

摘要

已测量了低能正电子碰撞产生的内壳层电离截面。采用薄硅锂（Si(Li)）晶体的X射线探测器的研制，使得首次能够测量能量低于30keV范围内正电子碰撞的绝对截面。将测量得到的铜K壳层和银L壳层截面的阈值行为与格里津斯基和科瓦尔斯基[《物理快报A》183, 196 (1993)]以及哈雷和瓦德赫拉[《加拿大物理学杂志》74, 376 (1996)]的理论结果进行了比较。发现铜K壳层的结果吻合良好，而银L壳层的实验值则小于相应的理论结果。

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