Deschamps M C, Michaud M, Sanche L
Departement de Medecine Nucleaire et Radiobiologie, Faculte de Medecine, Universite de Sherbrooke, Sherbrooke Quebec J1H 5N4, Canada.
J Chem Phys. 2004 Sep 1;121(9):4284-91. doi: 10.1063/1.1779570.
We report absolute electron scattering cross sections sigma(p) for the production of CO within thin solid film of carbon dioxide (CO(2)) condensed on a solid Ar substrate. The CO fragments, which remain trapped within the bulk of the carbon dioxide film, are detected in situ by recording energy losses to their lowest triplet electronic state a (3)Pi using high-resolution electron-energy-loss spectroscopy. The production of CO is studied as a function of the electron exposure, film thickness, and incident electron energy between 2 and 30 eV, a range within which most of the secondary electrons are created in systems irradiated by high-energy particles. The energy dependence is characterized by a feature around 4 eV with sigma(p)=(7.0+/-4.0)x10(-18) cm(2), a minimum around 7 eV, a strong rise up to a large and broad maximum around 15 eV with sigma(p)=(5.4+/-2.5)x10(-17) cm(2), a decrease to a minimum around 18.5 eV, and finally a monotonous increase up to 30 eV. The CO production is discussed in terms of the formation of electron resonances or transient anion states, which may lead directly to the fragmentation of the molecule via dissociative electron attachment or indirectly by decaying into an entirely repulsive part of the corresponding excited neutral and positive ion states.
我们报告了在凝聚于固态氩衬底上的二氧化碳(CO₂)薄固体膜中产生CO的绝对电子散射截面σ(p)。通过使用高分辨率电子能量损失谱记录CO碎片到其最低三重态电子态a³Π的能量损失,原位检测仍被困在二氧化碳膜主体内的CO碎片。研究了CO的产生与电子曝光量、膜厚度以及2至30 eV之间的入射电子能量的函数关系,在该能量范围内,大多数二次电子是在高能粒子辐照的系统中产生的。能量依赖性的特征是在4 eV左右有一个特征,σ(p) = (7.0 ± 4.0)×10⁻¹⁸ cm²,在7 eV左右有一个最小值,在15 eV左右强烈上升至一个大而宽的最大值,σ(p) = (5.4 ± 2.5)×10⁻¹⁷ cm²,在18.5 eV左右降至最小值,最后在30 eV之前单调增加。从电子共振或瞬态阴离子态的形成角度讨论了CO的产生,这可能通过解离电子附着直接导致分子碎片化,或通过衰变为相应激发中性和正离子态的完全排斥部分间接导致分子碎片化。