Richardson H, López-García I, Sferrazza M, Keddie J L
Department of Physics, University of Surrey, Guildford, Surrey GU2 7XH, United Kingdom.
Phys Rev E Stat Nonlin Soft Matter Phys. 2004 Nov;70(5 Pt 1):051805. doi: 10.1103/PhysRevE.70.051805. Epub 2004 Nov 22.
The isothermal structural relaxation of glassy, spin-cast polymer thin films has been investigated. Specifically, the thickness h of freshly cast poly(methyl methacrylate) thin films was measured over time using spectroscopic ellipsometry. The spin-cast films exhibit a gradual decrease in thickness, which is attributed to structural relaxation of the glass combined with simultaneous solvent loss. In all cases, h was found to be greater than the equilibrium thickness h(infinity) , which is obtained by cooling slowly from the melt. It is observed that both the rate of the volume relaxation and the fractional departure from h(infinity) (referred to as delta(0) ) increase with increasing film thickness. In the limit of very thin films, the initial h is close to h(infinity) , and delta(0) is small, whereas in thick films (>500 nm) , a plateau value of delta(0) of 0.16 is observed, which is close to the volume fraction of the solvent at the vitrification point. This dependence of delta(0) on thickness is observed regardless of the substrate, polymer molecular weight, or angular velocity during spin casting. Enhanced mobility near film surfaces could be leading to greater relaxation in thinner films prior to, and immediately after, the vitrification of the polymer during the deposition process.
对玻璃态旋涂聚合物薄膜的等温结构弛豫进行了研究。具体而言,使用光谱椭偏仪随时间测量了新旋涂的聚甲基丙烯酸甲酯薄膜的厚度h。旋涂薄膜的厚度逐渐减小,这归因于玻璃的结构弛豫以及同时发生的溶剂损失。在所有情况下,发现h大于通过从熔体缓慢冷却获得的平衡厚度h(∞)。观察到体积弛豫速率和与h(∞)的分数偏差(称为δ(0))均随薄膜厚度增加而增大。在非常薄的薄膜极限情况下,初始h接近h(∞),且δ(0)较小,而在厚膜(>500nm)中,观察到δ(0)的平台值为0.16,这接近玻璃化转变点处溶剂的体积分数。无论衬底、聚合物分子量或旋涂过程中的角速度如何,均观察到δ(0)对厚度的这种依赖性。薄膜表面附近增强的迁移率可能导致在沉积过程中聚合物玻璃化之前和之后,较薄薄膜中的弛豫程度更大。