Gao X P A, Boebinger G S, Mills A P, Ramirez A P, Pfeiffer L N, West K W
Los Alamos National Laboratory, Los Alamos, NM 87545, USA.
Phys Rev Lett. 2005 Mar 4;94(8):086402. doi: 10.1103/PhysRevLett.94.086402. Epub 2005 Mar 3.
We have studied the temperature dependent phonon emission rate P(T) of a strongly interacting (r(s) > or =22) dilute 2D GaAs hole system using a standard carrier heating technique. In the still poorly understood metallic state, we observe that P(T) changes from P(T) approximately T5 to P(T) approximately T7 above 100 mK, indicating a crossover from screened piezoelectric (PZ) coupling to screened deformation potential (DP) coupling for hole-phonon scattering. Quantitative comparison with theory shows that the long range PZ coupling between holes and phonons has the expected magnitude; however, in the metallic state, the short range DP coupling between holes and phonons is almost 20 times stronger than expected from theory. The density dependence of P(T) shows that it is easier to cool low-density 2D holes in GaAs than higher density 2D hole systems.
我们使用标准的载流子加热技术,研究了强相互作用(r(s)≥22)的二维稀磁砷化镓空穴系统中与温度相关的声子发射率P(T)。在目前仍了解不足的金属态中,我们观察到,在100 mK以上,P(T)从近似T5变化为近似T7,这表明空穴-声子散射从屏蔽压电(PZ)耦合转变为屏蔽形变势(DP)耦合。与理论的定量比较表明,空穴与声子之间的长程PZ耦合具有预期的量级;然而,在金属态中,空穴与声子之间的短程DP耦合比理论预期的要强近20倍。P(T)的密度依赖性表明,相比于高密度二维空穴系统,冷却低密度砷化镓二维空穴更容易。