Verhoeven J W, Cune M S
Afdeling Mondziekten, Kaakchirurgie en Bijzondere Tandheelkunde van het Universitair Medisch Centrum Utrecht.
Ned Tijdschr Tandheelkd. 2005 Mar;112(3):86-9.
Panoramic radiographs are frequently used for routine follow-up of mandibular implants. The objective of this study was to determine whether measurement on a panoramic radiograph of the vertical dimension of the mandible near by an implant, using the known implant length as a reference, is a reliable method. In 11 patients, 2 permucosal implants were placed in the anterior part of the edentulous mandible. During the first year after implantation, 2 panoramic radiographs and 2 sets of standardized oblique lateral cephalometric radiographs were made. Oblique lateral cephalometric radiographs are the golden standard for measuring the vertical dimension of an edentulous mandible. The length of the implants and the vertical dimension of the mandible dorsally to the implants were measured on all oblique lateral cephalometric radiographs. The measured and known implant length were used to calculate the image enlargement factor. This factor was used to calculate the real vertical dimension of the mandible. The same measurement procedures were performed on the panoramic radiographs. Using a paired t-test, the calculated values of the vertical dimensions of the mandibles found on panoramic radiographs were compared with the calculated values found on oblique lateral cephalometric radiographs. No statistically significant differences were found. It was concluded that under the described circumstances, panoramic radiographs can be used for reliable measurement of the vertical dimension of the mandible near by permucosal implants.
全景X线片常用于下颌种植体的常规随访。本研究的目的是确定以已知种植体长度为参照,通过全景X线片测量种植体附近下颌骨垂直尺寸的方法是否可靠。在11例患者的无牙下颌前部植入了2枚穿黏膜种植体。在植入后的第一年,拍摄了2张全景X线片和2组标准化的下颌骨侧斜位头影测量X线片。下颌骨侧斜位头影测量X线片是测量无牙下颌骨垂直尺寸的金标准。在所有下颌骨侧斜位头影测量X线片上测量种植体长度以及种植体后方下颌骨的垂直尺寸。用测量得到的种植体长度与已知的种植体长度计算影像放大系数。该系数用于计算下颌骨的实际垂直尺寸。在全景X线片上进行同样的测量程序。采用配对t检验,比较全景X线片上测得的下颌骨垂直尺寸计算值与下颌骨侧斜位头影测量X线片上测得的计算值。未发现统计学上的显著差异。得出的结论是,在所述情况下,全景X线片可用于可靠测量穿黏膜种植体附近下颌骨的垂直尺寸。