Maeda Koji, Matsumoto Masao
Department of Clinical Radiology, Faculty of Health Sciences, Hiroshima International University. 555-36 Gakuendai, Kurose-cho, Kamo-gun, Hiroshima Pref., 724-0695, Jap.
Igaku Butsuri. 2004;24(4):131-41.
Analysis of x-ray spectra is important for quality assurance (QA) and quality control (QC) of radiographic systems. This is especially true for mammographic x-ray imaging systems which require low-contrast detectability. Under clinical conditions, the measurement of diagnostic x-ray spectra is difficult because of pulse pile-up due to the high fluence rate of incident x-ray photons. However, it is difficult to set a long source-to-detector distance to reduce the number of photons detected per unit time for mammographic x-ray units. Compton spectroscopy is a suitable tool to deal with this problem. Detection of 90-degrees scattered photons only, energy correction and reconstruction are easy using the Klein-Nishina formula. However, x-ray spectra measured by this method have lower energy resolution, because of the geometrical irradiation angle or electron movement in the scatterer. Moreover, spectra measured with a compound semiconductor detector, such as a high resolution Schottky CdTe detector like we used, are distorted by the detector response, which is based on detecting x-ray photon interactions and charge carrier trapping in the semiconductor crystal. While the distortion of spectra caused by the response can be easily corrected by applying a stripping procedure, it is very difficult to reconstruct the broad spectra measured by Compton spectroscopy as sharp spectra such as obtained when directly measured. Some complicated reconstruction algorithms have been reported to fit the shape of spectra obtained by the Compton spectroscopy to sharp standard spectra. However, for QA / QC of the radiographic system, it is not necessary to correct the spectra sharply if the spectral broadening is at a tolerable level and the properties of the broad spectra acquired by the Compton spectroscopy agree with those of the sharp spectra measured directly; i.e. evaluations are necessary only for estimation of spectral shape. In this paper, we compared attenuation curves calculated using Hubbell's attenuation coefficients to estimate the coincidence or difference of spectra measured by the Compton spectroscopy and directly measured in the primary beam. Our results showed that the attenuation curves acquired from the reconstructed spectra measured by the Compton spectroscopy agreed with that acquired from corrected spectra that were directly measured. Moreover, the attenuation curves acquired from the spectra actually measured by adding aluminum attenuators agreed with theoretically calculated curves.
X射线光谱分析对于射线照相系统的质量保证(QA)和质量控制(QC)至关重要。对于需要低对比度可探测性的乳腺X射线成像系统而言尤其如此。在临床条件下,由于入射X射线光子的高通量率导致脉冲堆积,诊断性X射线光谱的测量变得困难。然而,对于乳腺X射线设备而言,难以设置较长的源到探测器距离以减少单位时间内检测到的光子数量。康普顿光谱学是解决此问题的合适工具。仅检测90度散射光子、进行能量校正和重建,使用克莱因-尼什纳公式就很容易。然而,由于几何辐照角度或散射体中的电子运动,通过这种方法测量的X射线光谱具有较低的能量分辨率。此外,用复合半导体探测器(如我们使用的高分辨率肖特基碲化镉探测器)测量的光谱会因探测器响应而失真,该响应基于检测半导体晶体中的X射线光子相互作用和电荷载流子俘获。虽然通过应用剥离程序可以轻松校正由响应引起的光谱失真,但将康普顿光谱学测量的宽光谱重建为直接测量时获得的尖锐光谱非常困难。已经报道了一些复杂的重建算法,以使康普顿光谱学获得的光谱形状与尖锐的标准光谱相匹配。然而,对于射线照相系统的QA/QC,如果光谱展宽处于可容忍水平且康普顿光谱学获得的宽光谱特性与直接测量的尖锐光谱特性一致,则无需对光谱进行精确校正;即仅需对光谱形状估计进行评估。在本文中,我们比较了使用哈贝尔衰减系数计算的衰减曲线,以估计通过康普顿光谱学测量的光谱与在原射线束中直接测量的光谱的一致性或差异。我们的结果表明,从康普顿光谱学测量的重建光谱获得的衰减曲线与从直接测量的校正光谱获得的衰减曲线一致。此外,从实际测量的添加铝衰减器的光谱获得的衰减曲线与理论计算曲线一致。