Nojima Kumie, Nakadai Taeko, Kohno Yukio, Vazquez Marcelo E, Yasuda Nakahiro, Nagaoka Shunji
International Space Radiation Laboratory, National Institute of Radiological Sciences (NIRS), Inage-ku, Chiba, Japan.
Biol Sci Space. 2004 Nov;18(3):114-5.
To investigate effects of low dose heavy particle radiation to CNS system, we adopted mouse neonatal brain cells in culture being exposed to heavy ions by HIMAC at NIRS and NSRL at BNL. The applied dose varied from 0.05 Gy up to 2.0 Gy. The subsequent biological effects were evaluated by an induction of apoptosis and neuron survival focusing on the dependencies of the animal strains, SCID, B6, B6C3F1, C3H, used for brain cell culture, SCID was the most sensitive and C3H the least sensitive to particle radiation as evaluated by 10% apoptotic criterion. The LET dependency was compared with using SCID and B6 cells exposing to different ions (H, C, Ne, Si, Ar, and Fe). Although no detectable LET dependency was observed in the high LET (55-200 keV/micrometers) and low dose (<0.5 Gy) regions. The survivability profiles of the neurons were different in the mouse strains and ions. In this report, a result of memory and learning function to adult mice after whole-body and brain local irradiation at carbon ion and iron ion.
为研究低剂量重粒子辐射对中枢神经系统的影响，我们采用了在日本国立放射医学综合研究所（NIRS）的HIMAC和美国布鲁克海文国家实验室（BNL）的NSRL对培养的小鼠新生脑细胞进行重离子照射。施加的剂量从0.05 Gy到2.0 Gy不等。通过诱导凋亡和神经元存活来评估后续的生物学效应，重点关注用于脑细胞培养的动物品系SCID、B6、B6C3F1、C3H的依赖性。以10%凋亡标准评估，SCID对粒子辐射最敏感，C3H最不敏感。通过使用暴露于不同离子（H、C、Ne、Si、Ar和Fe）的SCID和B6细胞比较传能线密度（LET）依赖性。尽管在高LET（55 - 200 keV/微米）和低剂量（<0.5 Gy）区域未观察到可检测的LET依赖性。神经元的存活情况在小鼠品系和离子中有所不同。在本报告中，给出了成年小鼠在全身和脑部局部接受碳离子和铁离子照射后的记忆和学习功能结果。
