Recnik Aleksander, Möbus Günter, Sturm Saso
Department for Nanostructured Materials, Jozef Stefan Institute, Jamova 39, 1000 Ljubljana, Slovenia.
Ultramicroscopy. 2005 Jul;103(4):285-301. doi: 10.1016/j.ultramic.2005.01.003. Epub 2005 Mar 14.
We have developed a new method for processing distorted high-resolution scanning transmission electron microscopy (STEM) images. The method is based on finding the displaced vertices in the experimental STEM image and warping to geometrically correct reference grid of the object. As a reference grid for warping a structural model obtained using a high-resolution transmission electron microscopy (HRTEM) analysis of the area of interest is utilised. Combined with quantitative HRTEM analysis the IMAGE-WARP method provides a real-space restoration of high-resolution high-angle annular dark-field (HAADF) STEM images without affecting the original Z-contrast information. The method can be applied to extract valuable compositional atomic-column data from any HAADF-STEM image of any kind of bulk crystals with local occupancy or chemistry fluctuations, stacking faults, special grain boundaries or interfaces, for which we have an available structural model. After the warping, distortion-corrected images can be further enhanced using conventional image-filtering techniques, and finally quantified with HAADF-STEM image simulations. The applicability of the IMAGE-WARP method was illustrated using experimental HAADF-STEM images of a strontium titanate crystal disrupted with a Ruddlesden-Popper-type antiphase boundary.
我们开发了一种处理失真的高分辨率扫描透射电子显微镜(STEM)图像的新方法。该方法基于在实验STEM图像中找到位移顶点,并将其扭曲到物体的几何正确参考网格。作为扭曲的参考网格,使用对感兴趣区域进行高分辨率透射电子显微镜(HRTEM)分析获得的结构模型。结合定量HRTEM分析,IMAGE-WARP方法可对高分辨率高角度环形暗场(HAADF)STEM图像进行实空间恢复,而不会影响原始的Z对比度信息。该方法可应用于从任何具有局部占有率或化学波动、堆垛层错、特殊晶界或界面的块状晶体的任何HAADF-STEM图像中提取有价值的成分原子列数据,前提是我们有可用的结构模型。扭曲后,失真校正的图像可以使用传统的图像滤波技术进一步增强,最后通过HAADF-STEM图像模拟进行量化。使用含有Ruddlesden-Popper型反相边界的钛酸锶晶体的实验HAADF-STEM图像说明了IMAGE-WARP方法的适用性。