Robb Paul D, Craven Alan J
Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK.
Ultramicroscopy. 2008 Dec;109(1):61-9. doi: 10.1016/j.ultramic.2008.08.001. Epub 2008 Aug 12.
An image processing technique is presented for atomic resolution high-angle annular dark-field (HAADF) images that have been acquired using scanning transmission electron microscopy (STEM). This technique is termed column ratio mapping and involves the automated process of measuring atomic column intensity ratios in high-resolution HAADF images. This technique was developed to provide a fuller analysis of HAADF images than the usual method of drawing single intensity line profiles across a few areas of interest. For instance, column ratio mapping reveals the compositional distribution across the whole HAADF image and allows a statistical analysis and an estimation of errors. This has proven to be a very valuable technique as it can provide a more detailed assessment of the sharpness of interfacial structures from HAADF images. The technique of column ratio mapping is described in terms of a [110]-oriented zinc-blende structured AlAs/GaAs superlattice using the 1 angstroms-scale resolution capability of the aberration-corrected SuperSTEM 1 instrument.
本文介绍了一种用于处理通过扫描透射电子显微镜（STEM）获得的原子分辨率高角度环形暗场（HAADF）图像的图像处理技术。该技术被称为柱比映射，涉及在高分辨率HAADF图像中自动测量原子柱强度比的过程。开发此技术的目的是比通常在几个感兴趣区域绘制单个强度线轮廓的方法更全面地分析HAADF图像。例如，柱比映射揭示了整个HAADF图像中的成分分布，并允许进行统计分析和误差估计。事实证明，这是一种非常有价值的技术，因为它可以从HAADF图像中对界面结构的清晰度提供更详细的评估。使用像差校正的SuperSTEM 1仪器的1埃尺度分辨率能力，以[110]取向的闪锌矿结构AlAs/GaAs超晶格为例描述了柱比映射技术。
