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通过透射电子显微镜对在有机分子晶体上获得的蚀刻图形进行观察。

Observation by transmission electron microscopy of etch figures obtained on an organic molecular crystal.

作者信息

Mercier M, Raimi M K, Bonpunt L

机构信息

Département de Microscopie Electronique, Université Bordeaux I, Talence, France.

出版信息

Microsc Res Tech. 1992 Mar 1;21(1):53-8. doi: 10.1002/jemt.1070210108.

Abstract

It is interesting to apply the method of etch figures to the study of organic molecular crystal defects, by observing the etch pits as soon as they are produced. We have set up a method to determine the geometrical forms of such small etch pits, observed on pre-shadowed replicas of naphthalene crystal surfaces. The described experimental procedure was designed to avoid artefacts due to vacuum sublimation and moisture traces on the replicated surface. Stereoscopic observation makes interpretation possible. The 3-D morphology and size of etch figures smaller than 1 micron can be determined.

摘要

将蚀刻图形法应用于有机分子晶体缺陷的研究是很有趣的,即一旦蚀刻坑产生就对其进行观察。我们已经建立了一种方法来确定在萘晶体表面的预阴影复制品上观察到的这种小蚀刻坑的几何形状。所描述的实验程序旨在避免由于复制表面上的真空升华和水分痕迹而产生的假象。立体观察使解释成为可能。可以确定小于1微米的蚀刻图形的三维形态和尺寸。

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Subliming ice surfaces: freeze-etch electron microscopy.升华冰面:冷冻蚀刻电子显微镜。
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