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《IPEMB关于300 kV以下产生电位(0.035毫米铝 - 4毫米铜半值层)X射线吸收剂量测定的操作规范》补遗

Addendum to the IPEMB code of practice for the determination of absorbed dose for x-rays below 300 kV generating potential (0.035 mm Al-4 mm Cu HVL).

作者信息

Aukett R J, Burns J E, Greener A G, Harrison R M, Moretti C, Nahum A E, Rosser K E

机构信息

Institute of Physics and Engineering in Medicine, Fairmount House, 230 Tadcaster Road, York YO24 1ES, UK.

出版信息

Phys Med Biol. 2005 Jun 21;50(12):2739-48. doi: 10.1088/0031-9155/50/12/001. Epub 2005 May 25.

DOI:10.1088/0031-9155/50/12/001
PMID:15930599
Abstract

This addendum to the code of practice for the determination of absorbed dose for x-rays below 300 kV has recently been approved by the IPEM and introduces three main changes: (i) Due to a lack of available data the original code recommended a value of unity for k(ch) in the very-low-energy range (0.035-1.0 mm Al HVL). A single table of k(ch) values, ranging from 1.01 to 1.07, applicable to both designated chamber types is now presented. (ii) For medium-energy x-rays (0.5-4 mm Cu HVL) methods are given to determine the absorbed dose to water either at 2 cm depth or at the surface of a phantom depending on clinical needs. Determination of the dose at the phantom surface is derived from an in-air measurement and by extending the low-energy range up to 4 mm Cu HVL. Relevant backscatter factors and ratios of mass energy absorption coefficients are given in the addendum. (iii) Relative dosimetry: although not normally forming part of a dosimetry code of practice a brief review of the current literature on this topic has been added as an appendix. This encompasses advice on techniques for measuring depth doses, applicator factors for small field sizes, dose fall off with increasing SSD and choice of appropriate phantom materials and ionization chambers.

摘要

这份《300 kV以下X射线吸收剂量测定操作规范附录》最近已获IPEM批准,引入了三项主要变更:(i) 由于缺乏可用数据,原规范在极低能量范围(0.035 - 1.0 mm铝半值层)推荐k(ch)值为1。现给出了一个适用于两种指定电离室类型的k(ch)值表,范围从1.01至1.07。(ii) 对于中能X射线(0.5 - 4 mm铜半值层),根据临床需求给出了在2 cm深度或模体表面确定水吸收剂量的方法。模体表面剂量的确定源自空气中测量,并通过将低能范围扩展至4 mm铜半值层来实现。附录中给出了相关的反向散射因子和质能吸收系数比值。(iii) 相对剂量学:虽然通常不属于剂量测定操作规范的一部分,但作为附录增加了对该主题当前文献的简要综述。其中包括关于深度剂量测量技术、小射野施源器因子、剂量随源皮距增加的衰减以及合适模体材料和电离室选择的建议。

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