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在以发育倒退为特征的一部分自闭症患者中,21号染色体长臂和7号染色体长臂存在连锁的证据。

Evidence for linkage on 21q and 7q in a subset of autism characterized by developmental regression.

作者信息

Molloy C A, Keddache M, Martin L J

机构信息

Center for Epidemiology and Biostatistics, Cincinnati Children's Hospital Medical Center, University of Cincinnati College of Medicine, Department of Pediatrics, Cincinnati, OH 45229-3039, USA.

出版信息

Mol Psychiatry. 2005 Aug;10(8):741-6. doi: 10.1038/sj.mp.4001691.

Abstract

Autism is a pervasive developmental disorder with a strong genetic component. While candidate regions of the genome have been identified, location of genes conferring susceptibility to autism has been hindered by the heterogeneity within this clinically defined disorder, and the likely contribution of many genes of weak effect. Subsetting samples on the basis of distinct, nondiagnostic clinical features has been recommended to decrease sample heterogeneity. In this study, linkage analysis was performed on a subset of families in the database of the Autism Genetic Resource Exchange (AGRE). This set of autism-affected relative pairs (n=34) was also concordant for a history of developmental regression as measured by the Autism Diagnostic Interview-Revised (ADI-R). In this sample, a maximum multipoint LOD score of 3.4 under the dominant mode of inheritance and an NPL score of 3.0 (P=1.3 x 10(-3)) were observed on chromosome 21 near D21S1437. On chromosome 7 near D7S483 a LOD score of 2.0 under the dominant mode of inheritance and an NPL score of 3.7 (P=7.9 x 10(-5)) were observed. Genetic elements in these regions of 21q and 7q are likely to confer susceptibility to autism or modify the disease presentation in a subgroup of children characterized by a history of developmental regression.

摘要

自闭症是一种具有很强遗传成分的广泛性发育障碍。虽然已经确定了基因组的候选区域,但由于这种临床定义疾病的异质性以及许多弱效应基因可能的作用,导致确定自闭症易感基因的位置受到阻碍。建议根据不同的非诊断性临床特征对样本进行分类,以减少样本的异质性。在本研究中,对自闭症遗传资源交换库(AGRE)数据库中的一部分家庭进行了连锁分析。这组受自闭症影响的亲属对(n = 34)在通过自闭症诊断访谈修订版(ADI-R)测量的发育倒退病史方面也具有一致性。在这个样本中,在21号染色体上靠近D21S1437处,显性遗传模式下的最大多点对数优势分数为3.4,正态离差检验分数为3.0(P = 1.3×10⁻³)。在7号染色体上靠近D7S483处,显性遗传模式下的对数优势分数为2.0,正态离差检验分数为3.7(P = 7.9×10⁻⁵)。21号染色体长臂(21q)和7号染色体长臂(7q)这些区域中的遗传元件可能使儿童亚组易患自闭症或改变疾病表现,这些儿童具有发育倒退病史。

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