Chu Kwang-lee, Kamata Akihito
Harcourt Assessment, Inc., 19500 Bulverde Rd, San Antonio, TX 78259-3701, USA.
J Appl Meas. 2005;6(3):342-54.
This paper proposes a multilevel measurement model that controls for DIF effects in test equating. The accuracy and stability of item and ability parameter estimates under the proposed multilevel measurement model were examined using randomly simulated data. Estimates from the proposed model were compared with those resulting from two multiple-group concurrent equating designs, including 1) a design that replaced DIF-items with items with no DIF; and 2) a design that retained DIF items with no attempt to control for DIF. In most of the investigated conditions, the results indicated that the proposed multilevel measurement model performed better than the two comparison models.
本文提出了一种在测验等值中控制差异项目功能(DIF)效应的多级测量模型。使用随机模拟数据检验了所提出的多级测量模型下项目参数和能力参数估计的准确性和稳定性。将所提出模型的估计结果与两种多组并发等值设计的结果进行了比较,这两种设计包括:1)用无DIF的项目替换有DIF的项目的设计;2)保留有DIF的项目且不试图控制DIF的设计。在大多数研究条件下,结果表明所提出的多级测量模型比两个比较模型表现更好。