Hack Erwin, Gundu Phanindra Narayan, Rastogi Pramod
Electronics Metrology Laboratory, Swiss Federal Laboratories for Materials Testing and Research (EMPA), Ueberlandstrasse 129, 8600 Duebendorf, Switzerland.
Appl Opt. 2005 May 10;44(14):2772-81. doi: 10.1364/ao.44.002772.
An innovative technique for reducing speckle noise and improving the intensity profile of the speckle correlation fringes is presented. The method is based on reducing the range of the modulation intensity values of the speckle interference pattern. After the fringe pattern is corrected adaptively at each pixel, a simple morphological filtering of the fringes is sufficient to obtain smoothed fringes. The concept is presented both analytically and by simulation by using computer-generated speckle patterns. The experimental verification is performed by using an amplitude-only spatial light modulator (SLM) in a conventional electronic speckle pattern interferometry setup. The optical arrangement for tuning a commercially available LCD array for amplitude-only behavior is described. The method of feedback to the LCD SLM to modulate the intensity of the reference beam in order to reduce the modulation intensity values is explained, and the resulting fringe pattern and increase in the signal-to-noise ratio are discussed.
本文提出了一种减少散斑噪声并改善散斑相关条纹强度分布的创新技术。该方法基于减小散斑干涉图案的调制强度值范围。在对每个像素的条纹图案进行自适应校正后,对条纹进行简单的形态学滤波就足以获得平滑的条纹。通过使用计算机生成的散斑图案,从解析和模拟两方面阐述了这一概念。在传统的电子散斑图案干涉测量装置中,使用仅具有振幅调制功能的空间光调制器(SLM)进行了实验验证。描述了将市售液晶显示器阵列调制成仅具有振幅调制功能的光学装置。解释了反馈到液晶空间光调制器以调制参考光束强度从而减小调制强度值的方法,并讨论了由此产生的条纹图案和信噪比的提高。