John Neena Susan, Kulkarni G U
Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Jakkur P.O., Bangalore-560064, India.
J Nanosci Nanotechnol. 2005 Apr;5(4):587-91. doi: 10.1166/jnn.2005.066.
Some aspects of the performance of gold-coated conductive probes used in conducting atomic force microscopy (C-AFM) technique are discussed. The resistance of the nanocontact between the gold-coated AFM tip and the graphite substrate has been monitored at various applied forces. For small forces (<50 nN), resistance on the order of a few kiloohms was observed. Minimal contact resistance was observed for forces in the range 100-150 nN, beyond which the tip seems to undergo plastic deformation. The resistance of the nanocontact increased when current on the order of 100 microA was allowed to pass through, finally resulting in melting of the gold coating.
讨论了用于导电原子力显微镜（C-AFM）技术的镀金导电探针性能的一些方面。已在各种施加力下监测了镀金原子力显微镜尖端与石墨基底之间纳米接触的电阻。对于小力（<50 nN），观察到电阻在几千欧姆量级。在100 - 150 nN范围内的力下观察到最小接触电阻，超过此范围尖端似乎会发生塑性变形。当允许约100微安的电流通过时，纳米接触的电阻增加，最终导致金涂层熔化。
